Services - Thin Film Characterization

Optical Thin Film Characterization

K Lab has a variety of tools to characterize thin films. Our services include reflectance and transmission measurements, thin film thickness determination and dispersive index measurements, thickness mapping, and surface profiling.

• Wavelength range of 175nm - 3200nm
• Reflection and transmission measurements
• Single layer thickness and index measurements
• Multi-layer thickness and indexes measurements / simulations
• Thickness mapping of wafers up to 6"

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